Eidgenossische Materialprufungs -und Forschungsanstalt (EMPA)

Eidgenossische Materialprufungs -und Forschungsanstalt (Empa), Dübendorf, Switzerland

http://www.empa.ch/

MEMBERS

Miguel A. Marioni

miguel.marioniempa.ch

Academic function: P.I.

Research interests and expertise: Quantitative magnetic force microscopy, magnetic materials and structures, magnetometry, magnetron sputtering, thin films, exchange bias.

Hans J. Hug

hans-josef.hugempa.ch

Academic function: Senior Researcher.

Research interests and expertise: Scanning probe microscopy, magnetic materials and structures, magnetron sputtering, thin films, hard coatings, exchange bias, superconductors.

Mirko Bacani

mirko.bacaniempa.ch

Academic function: Post-doc.

Research interests and expertise: Magnetic oxides, quantitative magnetic force microscopy, superconducting materials.

Marcos Penedo

marcos.penedoempa.ch

Academic function: Post-doc.

Research interests and expertise: Scanning probe microscopy, magnetic materials and structures, magnetron sputtering.

Xue Zhao

xue.zhaoempa.ch

Academic function: Post-doc.

Research interests and expertise: Quantitative magnetic force microscopy, exchange coupled double layers.

Andrada O. Mandru

andrada-oana.mandruempa.ch

Academic function: Post-doc.

Research interests and expertise: Quantitative magnetic force microscopy, scanning tunneling microscopy, magnetic materials and structures, exchange coupled double layers.

Oguz Yildirim

oguz.yildirimempa.ch

Academic function: Post-doc.

Research interests and expertise: Magnetic materials and structures, magnetometry, magnetron sputtering.

THE EQUIPMENT

hr-MFM

  • Tool keeper contact information: miguel.marioniempa.ch.
  • Relevant details: Room temperature, non-contact vacuum magnetic force microscope (MFM). Scanner range 12 um. Sample: area, 3×3 cm2 max; height 3mm max. Applied fields 0.1T max.

It-MFM

  • Tool keeper contact information: miguel.marioni@spicolost.eu
  • Relevant details: Low temperature, non-contact UHV magnetic force microscope (MFM). Scanner range 6 um. Sample: area, 5×5 mm2 max; height 1mm max. Applied fields 7.0T max.